L. A. Knauss

2003
2	EE	L. A. Knauss, A. Orozco, S. I. Woods, A. B. Cawthorne: Advances in scanning SQUID microscopy for die-level and package-level fault isolation. Microelectronics Reliability 43(9-11): 1657-1662 (2003)
2001
1	EE	L. A. Knauss, A. B. Cawthorne, N. Lettsome, S. Kelly, S. Chatraphorn, E. F. Fleet, F. C. Wellstood, W. E. Vanderlinde: Scanning SQUID microscopy for current imaging. Microelectronics Reliability 41(8): 1211-1229 (2001)

Coauthor Index

1	A. B. Cawthorne	[1] [2]
2	S. Chatraphorn	[1]
3	E. F. Fleet	[1]
4	S. Kelly	[1]
5	N. Lettsome	[1]
6	A. Orozco	[2]
7	W. E. Vanderlinde	[1]
8	F. C. Wellstood	[1]
9	S. I. Woods	[2]