H. I. Kim
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2004
1
EE
K. S. Kim
, H. I. Kim,
C. H. Yu
,
E. G. Chang
: Fatigue analysis of high-speed photodiode submodule by using FEM.
Microelectronics Reliability 44
(1): 167-171 (2004)
Coauthor
Index
1
E. G. Chang
[
1
]
2
K. S. Kim
[
1
]
3
C. H. Yu
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
