Sophia W. Kao
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1995
1
EE
Li-C. Wang
,
M. Ray Mercer
, Sophia W. Kao,
Thomas W. Williams
: On the decline of testing efficiency as fault coverage approaches 100%.
VTS 1995
: 74-83
Coauthor
Index
1
M. Ray Mercer
[
1
]
2
Li-C. Wang
[
1
]
3
Thomas W. Williams
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)