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Sophia W. Kao

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1995
1EELi-C. Wang, M. Ray Mercer, Sophia W. Kao, Thomas W. Williams: On the decline of testing efficiency as fault coverage approaches 100%. VTS 1995: 74-83

Coauthor Index

1M. Ray Mercer [1]
2Li-C. Wang [1]
3Thomas W. Williams [1]

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