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Jean-Baptiste Kammerer

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2007
1EEBenoit Dubois, Jean-Baptiste Kammerer, Luc Hebrard, Francis Braun: Analytical Modeling of Hot-Carrier Induced Degradation of MOS Transistor for Analog Design for Reliability. ISQED 2007: 53-58

Coauthor Index

1Francis Braun [1]
2Benoit Dubois [1]
3Luc Hebrard [1]

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