2007 | ||
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1 | EE | Benoit Dubois, Jean-Baptiste Kammerer, Luc Hebrard, Francis Braun: Analytical Modeling of Hot-Carrier Induced Degradation of MOS Transistor for Analog Design for Reliability. ISQED 2007: 53-58 |
1 | Francis Braun | [1] |
2 | Luc Hebrard | [1] |
3 | Jean-Baptiste Kammerer | [1] |