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Benoit Dubois

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2007
1EEBenoit Dubois, Jean-Baptiste Kammerer, Luc Hebrard, Francis Braun: Analytical Modeling of Hot-Carrier Induced Degradation of MOS Transistor for Analog Design for Reliability. ISQED 2007: 53-58

Coauthor Index

1Francis Braun [1]
2Luc Hebrard [1]
3Jean-Baptiste Kammerer [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)