| |
| 2007 | ||
|---|---|---|
| 1 | EE | Benoit Dubois, Jean-Baptiste Kammerer, Luc Hebrard, Francis Braun: Analytical Modeling of Hot-Carrier Induced Degradation of MOS Transistor for Analog Design for Reliability. ISQED 2007: 53-58 |
| 1 | Francis Braun | [1] |
| 2 | Benoit Dubois | [1] |
| 3 | Jean-Baptiste Kammerer | [1] |