| |
| 2002 | ||
|---|---|---|
| 1 | EE | F. Velardi, F. Iannuzzo, G. Busatto, J. Wyss, A. Kaminksy: The Reliability of New Generation Power MOSFETs in Radiation Environment. Microelectronics Reliability 42(9-11): 1629-1634 (2002) |
| 1 | G. Busatto | [1] |
| 2 | F. Iannuzzo | [1] |
| 3 | F. Velardi | [1] |
| 4 | J. Wyss | [1] |