2006 |
3 | EE | A. S. Fleischer,
U. Troppenz,
M. Hamacher,
W. John:
Thermal analysis of bond layer influence on performance of an all-active vertically coupled, microring resonating laser.
Microelectronics Reliability 46(2-4): 421-431 (2006) |
1995 |
2 | | M. Deegener,
W. John,
B. Kühnapfel,
Michael Löhr,
Gregor Lux,
Hanno Wirth:
A Basic Architecture for the Development of a Distributed Interactive Simulator.
EUROSIM 1995: 357-362 |
1994 |
1 | EE | Dirk Theune,
Ralf Thiele,
W. John,
Thomas Lengauer:
Robust methods for EMC-driven routing.
IEEE Trans. on CAD of Integrated Circuits and Systems 13(11): 1366-1378 (1994) |