D. Jiménez
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2003
1
EE
Jordi Suñé
,
Ernest Y. Wu
, D. Jiménez,
Wing L. Lai
: Statistics of soft and hard breakdown in thin SiO
2
gate oxides.
Microelectronics Reliability 43
(8): 1185-1192 (2003)
Coauthor
Index
1
Wing L. Lai
[
1
]
2
Jordi Suñé
[
1
]
3
Ernest Y. Wu
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
