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Göran Jerke

Goeran Jerke

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2005
6EEJens Lienig, Göran Jerke: Electromigration-Aware Physical Design of Integrated Circuits. VLSI Design 2005: 77-82
2004
5EEGoeran Jerke, Jens Lienig, Jürgen Scheible: Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs. DAC 2004: 181-184
4EEGöran Jerke, Jens Lienig: Hierarchical current-density verification in arbitrarily shaped metallization patterns of analog circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 23(1): 80-90 (2004)
2002
3EEGoeran Jerke, Jens Lienig: Hierarchical Current Density Verification for Electromigration Analysis in Arbitrary Shaped Metallization Patterns of Analog Circuits. DATE 2002: 464-469
2EEJens Lienig, Goeran Jerke, Thorsten Adler: Electromigration Avoidance in Analog Circuits: Two Methodologies for Current-Driven Routing. VLSI Design 2002: 372-
2001
1EEJens Lienig, Goeran Jerke, Thorsten Adler: AnalogRouter: a new approach of current-driven routing for analog circuits. DATE 2001: 819

Coauthor Index

1Thorsten Adler [1] [2]
2Jens Lienig [1] [2] [3] [4] [5] [6]
3Jürgen Scheible [5]

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