Lavanya Jagan
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2009
1
EE
Lavanya Jagan,
Ratan Deep Singh
,
V. Kamakoti
,
Ananta K. Majhi
: Efficient Grouping of Fail Chips for Volume Yield Diagnostics.
VLSI Design 2009
: 97-102
Coauthor
Index
1
V. Kamakoti
[
1
]
2
Ananta K. Majhi
[
1
]
3
Ratan Deep Singh
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
