| |
| 2005 | ||
|---|---|---|
| 1 | Yasumasa Tsukamoto, Koji Nii, Susumu Imaoka, Yuji Oda, Shigeki Ohbayashi, Tomoaki Yoshizawa, Hiroshi Makino, Koichiro Ishibashi, Hirofumi Shinohara: Worst-case analysis to obtain stable read/write DC margin of high density 6T-SRAM-array with local Vth variability. ICCAD 2005: 398-405 | |
| 1 | Koichiro Ishibashi | [1] |
| 2 | Hiroshi Makino | [1] |
| 3 | Koji Nii | [1] |
| 4 | Yuji Oda | [1] |
| 5 | Shigeki Ohbayashi | [1] |
| 6 | Hirofumi Shinohara | [1] |
| 7 | Yasumasa Tsukamoto | [1] |
| 8 | Tomoaki Yoshizawa | [1] |