Ki Soo Hwang

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1986

2 Ki Soo Hwang, M. Ray Mercer: Informed Test Generation Guidance Using Partially Specified Fanout Constraints. ITC 1986: 113-120

1 EE Ki Soo Hwang, M. Ray Mercer: Derivation and Refinement of Fan-Out Constraints to Generate Tests in Combinational Logic Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 5(4): 564-572 (1986)

1986
2		Ki Soo Hwang, M. Ray Mercer: Informed Test Generation Guidance Using Partially Specified Fanout Constraints. ITC 1986: 113-120
1	EE	Ki Soo Hwang, M. Ray Mercer: Derivation and Refinement of Fan-Out Constraints to Generate Tests in Combinational Logic Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 5(4): 564-572 (1986)

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