2008 |
6 | EE | Fawnizu Azmadi Hussin,
Tomokazu Yoneda,
Alex Orailoglu,
Hideo Fujiwara:
Scheduling Power-Constrained Tests through the SoC Functional Bus.
IEICE Transactions 91-D(3): 736-746 (2008) |
5 | EE | Fawnizu Azmadi Hussin,
Tomokazu Yoneda,
Hideo Fujiwara:
On NoC Bandwidth Sharing for the Optimization of Area Cost and Test Application Time.
IEICE Transactions 91-D(7): 1999-2007 (2008) |
4 | EE | Fawnizu Azmadi Hussin,
Tomokazu Yoneda,
Hideo Fujiwara:
NoC-Compatible Wrapper Design and Optimization under Channel-Bandwidth and Test-Time Constraints.
IEICE Transactions 91-D(7): 2008-2017 (2008) |
2007 |
3 | EE | Fawnizu Azmadi Hussin,
Tomokazu Yoneda,
Alex Orailoglu,
Hideo Fujiwara:
Core-Based Testing of Multiprocessor System-on-Chips Utilizing Hierarchical Functional Buses.
ASP-DAC 2007: 720-725 |
2 | EE | Fawnizu Azmadi Hussin,
Tomokazu Yoneda,
Hideo Fujiwara:
Optimization of NoC Wrapper Design under Bandwidth and Test Time Constraints.
European Test Symposium 2007: 35-42 |
2006 |
1 | EE | Fawnizu Azmadi Hussin,
Tomokazu Yoneda,
Alex Orailoglu,
Hideo Fujiwara:
Power-Constrained SOC Test Schedules through Utilization of Functional Buses.
ICCD 2006 |