Jason P. Hurst

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1995

2 EE Jason P. Hurst, Nick Kanopoulos: Flip-flop sharing in standard scan path to enhance delay fault testing of sequential circuits. Asian Test Symposium 1995: 346-352

1 EE Jason P. Hurst, Adit D. Singh: A differential built-in current sensor design for high speed IDDQ testing. VLSI Design 1995: 419-423

1995
2	EE	Jason P. Hurst, Nick Kanopoulos: Flip-flop sharing in standard scan path to enhance delay fault testing of sequential circuits. Asian Test Symposium 1995: 346-352
1	EE	Jason P. Hurst, Adit D. Singh: A differential built-in current sensor design for high speed IDDQ testing. VLSI Design 1995: 419-423

Coauthor Index

1 Nick Kanopoulos [2]

2 Adit D. Singh [1]

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