| |
| 2001 | ||
|---|---|---|
| 1 | EE | Javier Mateos, Tomás González, Daniel Pardo, Virginie Hoel, Alain Cappy: Monte Carlo simulation of electronic characteristics in short channel delta-doped AlInAs/GaInAs HEMTs. Microelectronics Reliability 41(1): 73-77 (2001) |
| 1 | Alain Cappy | [1] |
| 2 | Tomás González | [1] |
| 3 | Javier Mateos | [1] |
| 4 | Daniel Pardo | [1] |