2001 | ||
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1 | EE | Javier Mateos, Tomás González, Daniel Pardo, Virginie Hoel, Alain Cappy: Monte Carlo simulation of electronic characteristics in short channel delta-doped AlInAs/GaInAs HEMTs. Microelectronics Reliability 41(1): 73-77 (2001) |
1 | Tomás González | [1] |
2 | Virginie Hoel | [1] |
3 | Javier Mateos | [1] |
4 | Daniel Pardo | [1] |