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Tomás González

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2001
1EEJavier Mateos, Tomás González, Daniel Pardo, Virginie Hoel, Alain Cappy: Monte Carlo simulation of electronic characteristics in short channel delta-doped AlInAs/GaInAs HEMTs. Microelectronics Reliability 41(1): 73-77 (2001)

Coauthor Index

1Alain Cappy [1]
2Virginie Hoel [1]
3Javier Mateos [1]
4Daniel Pardo [1]

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