Isao Higashi
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1997
1
EE
Michinobu Nakao
,
Kazumi Hatayama
, Isao Higashi: Accelerated Test Points Selection Method for Scan-Based BIST.
Asian Test Symposium 1997
: 359-
Coauthor
Index
1
Kazumi Hatayama
[
1
]
2
Michinobu Nakao
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)