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Isao Higashi

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1997
1EEMichinobu Nakao, Kazumi Hatayama, Isao Higashi: Accelerated Test Points Selection Method for Scan-Based BIST. Asian Test Symposium 1997: 359-

Coauthor Index

1Kazumi Hatayama [1]
2Michinobu Nakao [1]

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