| |
| 2000 | ||
|---|---|---|
| 2 | EE | Ray Haythornthwaite: Failure Mechanisms in Semiconductor Memory Circuits. MTDT 2000: 7-13 |
| 1999 | ||
| 1 | EE | Sue Brown, Jeff Campbell, Sherri Griffin, Dick James, Ray Haythornthwaite: Failure Mechanisms Detected in Memory Chips during Routine Construction Analysis. MTDT 1999: 34-39 |
| 1 | Sue Brown | [1] |
| 2 | Jeff Campbell | [1] |
| 3 | Sherri Griffin | [1] |
| 4 | Dick James | [1] |