| |
| 1999 | ||
|---|---|---|
| 1 | EE | Sue Brown, Jeff Campbell, Sherri Griffin, Dick James, Ray Haythornthwaite: Failure Mechanisms Detected in Memory Chips during Routine Construction Analysis. MTDT 1999: 34-39 |
| 1 | Sue Brown | [1] |
| 2 | Jeff Campbell | [1] |
| 3 | Ray Haythornthwaite | [1] |
| 4 | Dick James | [1] |