2001 | ||
---|---|---|
2 | EE | Chisato Hashimoto, Takamitsu Takizawa, Sigeru Nakajima, Mitsuru Shinagawa, Tadao Nagatsuma: Observation of the internal waveforms in high-speed high-density LSIs using an EOS prober. Microelectronics Reliability 41(8): 1203-1209 (2001) |
1993 | ||
1 | EE | Shinji Nakamura, Chisato Hashimoto, Osamu Mori: Precise and flexible modeling for semiconductor wafer fabrication. Winter Simulation Conference 1993: 804-813 |
1 | Osamu Mori | [1] |
2 | Tadao Nagatsuma | [2] |
3 | Sigeru Nakajima | [2] |
4 | Shinji Nakamura | [1] |
5 | Mitsuru Shinagawa | [2] |
6 | Takamitsu Takizawa | [2] |