2001 | ||
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1 | EE | Chisato Hashimoto, Takamitsu Takizawa, Sigeru Nakajima, Mitsuru Shinagawa, Tadao Nagatsuma: Observation of the internal waveforms in high-speed high-density LSIs using an EOS prober. Microelectronics Reliability 41(8): 1203-1209 (2001) |
1 | Chisato Hashimoto | [1] |
2 | Tadao Nagatsuma | [1] |
3 | Sigeru Nakajima | [1] |
4 | Mitsuru Shinagawa | [1] |