S. Haendler
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2001
1
EE
S. Haendler,
J. Jomaah
,
G. Ghibaudo
,
F. Balestra
: Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors.
Microelectronics Reliability 41
(6): 855-860 (2001)
Coauthor
Index
1
F. Balestra
[
1
]
2
G. Ghibaudo
[
1
]
3
J. Jomaah
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
