| |
| 1995 | ||
|---|---|---|
| 2 | EE | Wen-Ben Jone, Paresh Gondalia, Allan Gutjahr: Realizing a high measure of confidence for defect level analysis of random testing [VLSI]. IEEE Trans. VLSI Syst. 3(3): 446-450 (1995) |
| 1993 | ||
| 1 | Paresh Gondalia, Allan Gutjahr, Wen-Ben Jone: Realizing a High Measure of Confidence for Defect Level Analysis of Random Testing. ITC 1993: 478-487 | |
| 1 | Paresh Gondalia | [1] [2] |
| 2 | Wen-Ben Jone | [1] [2] |