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Paresh Gondalia

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1995
2EEWen-Ben Jone, Paresh Gondalia, Allan Gutjahr: Realizing a high measure of confidence for defect level analysis of random testing [VLSI]. IEEE Trans. VLSI Syst. 3(3): 446-450 (1995)
1993
1 Paresh Gondalia, Allan Gutjahr, Wen-Ben Jone: Realizing a High Measure of Confidence for Defect Level Analysis of Random Testing. ITC 1993: 478-487

Coauthor Index

1Allan Gutjahr [1] [2]
2Wen-Ben Jone [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)