B. Guillaumot
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2003
1
EE
F. Lime
,
G. Ghibaudo
, B. Guillaumot: Charge trapping in SiO2/HfO2/TiN gate stack.
Microelectronics Reliability 43
(9-11): 1445-1448 (2003)
Coauthor
Index
1
G. Ghibaudo
[
1
]
2
F. Lime
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
