2006 |
7 | EE | Xiaokang Guan,
A. Wang,
A. Ishikawa,
T. Tamura,
Zhihua Wang,
Chun Zhang:
A 3V 110µW 3.1 ppm/°C curvature-compensated CMOS bandgap reference.
ISCAS 2006 |
2004 |
6 | EE | Rouying Zhan,
Haigang Feng,
Qiong Wu,
Xiaokang Guan,
Guang Chen,
Haolu Xie,
Albert Z. Wang:
Concept and extraction method of ESD-critical parameters for function-based layout-level ESD protection circuit design verification.
ASP-DAC 2004: 710-712 |
5 | EE | Rouying Zhan,
Haigang Feng,
Qiong Wu,
Haolu Xie,
Xiaokang Guan,
Guang Chen,
Albert Z. Wang:
ESDInspector: a new layout-level ESD protection circuitry design verification tool using a smart-parametric checking mechanism.
IEEE Trans. on CAD of Integrated Circuits and Systems 23(10): 1421-1428 (2004) |
2003 |
4 | EE | Haigang Feng,
Rouying Zhan,
Guang Chen,
Qiong Wu,
Xiaokang Guan,
Haolu Xie,
Albert Z. Wang:
Bonding-pad-oriented on-chip ESD protection structures for ICs.
ISCAS (1) 2003: 741-744 |
3 | EE | Haigang Feng,
Rouying Zhan,
Qiong Wu,
Guang Chen,
Xiaokang Guan,
Haolu Xie,
Albert Z. Wang:
Mixed-mode ESD protection circuit simulation-design methodology.
ISCAS (4) 2003: 652-655 |
2 | EE | Rouying Zhan,
Haigang Feng,
Qiong Wu,
Haolu Xie,
Xiaokang Guan,
Guang Chen,
Albert Z. Wang:
ESDExtractor: A new technology-independent CAD tool for arbitrary ESD protection device extraction.
IEEE Trans. on CAD of Integrated Circuits and Systems 22(10): 1362-1370 (2003) |
2002 |
1 | EE | Rouying Zhan,
Haigang Feng,
Qiong Wu,
Guang Chen,
Xiaokang Guan,
Albert Z. Wang:
A technology-independent CAD tool for ESD protection device extraction: ESDExtractor.
ICCAD 2002: 510-513 |