1999 | ||
---|---|---|
4 | EE | Jue Wu, Gary S. Greenstein, Elizabeth M. Rudnick: A Fault List Reduction Approach for Efficient Bridge Fault Diagnosis. DATE 1999: 780-781 |
1997 | ||
3 | EE | Elizabeth M. Rudnick, Janak H. Patel, Gary S. Greenstein, Thomas M. Niermann: A genetic algorithm framework for test generation. IEEE Trans. on CAD of Integrated Circuits and Systems 16(9): 1034-1044 (1997) |
1994 | ||
2 | EE | Elizabeth M. Rudnick, Janak H. Patel, Gary S. Greenstein, Thomas M. Niermann: Sequential Circuit Test Generation in a Genetic Algorithm Framework. DAC 1994: 698-704 |
1992 | ||
1 | EE | Gary S. Greenstein, Janak H. Patel: E-PROOFS: a CMOS bridging fault simulator. ICCAD 1992: 268-271 |
1 | Thomas M. Niermann | [2] [3] |
2 | Janak H. Patel | [1] [2] [3] |
3 | Elizabeth M. Rudnick | [2] [3] [4] |
4 | Jue Wu | [4] |