2005 |
3 | EE | Junichi Hirase,
Yoshiyuki Goi,
Yoshiyuki Tanaka:
IDDQ Testing Method using a Scan Pattern for Production Testing.
Asian Test Symposium 2005: 18-21 |
1992 |
2 | | Hiraku Nakano,
Masaitsu Nakajima,
Yasuhiro Nakakura,
Tadahiro Yoshida,
Yoshiyuki Goi,
Yuji Nakai,
Reiji Segawa,
Takeshi Kishida:
An Accurate, High Speed Implementation of Division by the Quasi-Unity Divisor Method.
IFIP Congress (1) 1992: 261-267 |
1991 |
1 | EE | Masaitsu Nakajima,
Hiraku Nakano,
Yasuhiro Nakakura,
Tadahiro Yoshida,
Yoshiyuki Goi,
Yuji Nakai,
Reiji Segawa,
Takeshi Kishida,
Hiroshi Kadota:
OHMEGA: A VLSI Superscalar Processor Architecture for Numerical Applications.
ISCA 1991: 160-168 |