2004 | ||
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3 | EE | M. S. Gaur, Mark Zwolinski: Integrating Self Testability with Design Space Exploration by a Controller based Estimation Technique. VLSI Design 2004: 901-906 |
2003 | ||
2 | EE | Mark Zwolinski, M. S. Gaur: Integrating testability with design space exploration. Microelectronics Reliability 43(5): 685-693 (2003) |
1997 | ||
1 | EE | Y. Narahari, N. Hemachandra, M. S. Gaur: Transient analysis of multiclass manufacturing systems with priority scheduling. Computers & OR 24(5): 387-398 (1997) |
1 | N. Hemachandra | [1] |
2 | Y. Narahari (Yadati Narahari) | [1] |
3 | Mark Zwolinski | [2] [3] |