| |
| 2003 | ||
|---|---|---|
| 2 | EE | Frank Gao: High reliability in PHEMT MMICs with dual-etch-stop AlAs layers for high-speed RF switch applications. Microelectronics Reliability 43(6): 829-837 (2003) |
| 2002 | ||
| 1 | EE | Frank Gao, Ravi Chanana, Tom Nicholls: The effects of buffer thickness on GaAs MESFET characteristics: channel-substrate current, drain breakdown, and reliability. Microelectronics Reliability 42(7): 1003-1010 (2002) |
| 1 | Ravi Chanana | [1] |
| 2 | Tom Nicholls | [1] |