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| 2002 | ||
|---|---|---|
| 1 | EE | Frank Gao, Ravi Chanana, Tom Nicholls: The effects of buffer thickness on GaAs MESFET characteristics: channel-substrate current, drain breakdown, and reliability. Microelectronics Reliability 42(7): 1003-1010 (2002) |
| 1 | Frank Gao | [1] |
| 2 | Tom Nicholls | [1] |