| |
| 2006 | ||
|---|---|---|
| 3 | EE | Mohammadreza Keimasi, Sanka Ganesan, Michael G. Pecht: Low temperature electrical measurements of silicon bipolar monolithic microwave integrated circuit (MMIC) amplifiers. Microelectronics Reliability 46(2-4): 326-334 (2006) |
| 2 | EE | Sanka Ganesan, Michael G. Pecht, Sharon Ling: Use of high temperature operating life data to mitigate risks in long-duration space applications that deploy commercial-grade plastic encapsulated semiconductor devices. Microelectronics Reliability 46(2-4): 360-366 (2006) |
| 1 | EE | Daniel N. Donahoe, Michael G. Pecht, Isabel K. Lloyd, Sanka Ganesan: Moisture induced degradation of multilayer ceramic capacitors. Microelectronics Reliability 46(2-4): 400-408 (2006) |
| 1 | Daniel N. Donahoe | [1] |
| 2 | Mohammadreza Keimasi | [3] |
| 3 | Sharon Ling | [2] |
| 4 | Isabel K. Lloyd | [1] |
| 5 | Michael G. Pecht | [1] [2] [3] |