| |
| 1995 | ||
|---|---|---|
| 1 | A. Frisch, Mitch Aigner, T. Almy, Hans J. Greub, M. Hazra, S. Mohr, Nicholas J. Naclerio, W. Russell, M. Stebniskey: Supplying Known-Good Die for MCM Applications Using Low-Cost Embedded Testing. ITC 1995: 328-335 | |
| 1 | Mitch Aigner | [1] |
| 2 | T. Almy | [1] |
| 3 | Hans J. Greub | [1] |
| 4 | M. Hazra | [1] |
| 5 | S. Mohr | [1] |
| 6 | Nicholas J. Naclerio | [1] |
| 7 | W. Russell | [1] |
| 8 | M. Stebniskey | [1] |