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T. Almy

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1995
1 A. Frisch, Mitch Aigner, T. Almy, Hans J. Greub, M. Hazra, S. Mohr, Nicholas J. Naclerio, W. Russell, M. Stebniskey: Supplying Known-Good Die for MCM Applications Using Low-Cost Embedded Testing. ITC 1995: 328-335

Coauthor Index

1Mitch Aigner [1]
2A. Frisch [1]
3Hans J. Greub [1]
4M. Hazra [1]
5S. Mohr [1]
6Nicholas J. Naclerio [1]
7W. Russell [1]
8M. Stebniskey [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)