| |
| 1995 | ||
|---|---|---|
| 2 | Martin A. Lutz, Randall M. Feenstra, Jack O. Chu: Atomic force microscopy studies of SiGe films and Si/SiGe heterostructures. IBM Journal of Research and Development 39(6): 629-638 (1995) | |
| 1992 | ||
| 1 | Tung-Sheng Kuan, Philip E. Batson, Randall M. Feenstra, Alan J. Slavin, Ruud M. Tromp: Application of electron and ion beam analysis techniques to microelectronics. IBM Journal of Research and Development 36(2): 183-207 (1992) | |
| 1 | Philip E. Batson | [1] |
| 2 | Jack O. Chu | [2] |
| 3 | Tung-Sheng Kuan | [1] |
| 4 | Martin A. Lutz | [2] |
| 5 | Alan J. Slavin | [1] |
| 6 | Ruud M. Tromp | [1] |