Martin A. Lutz
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1995
1
Martin A. Lutz,
Randall M. Feenstra
,
Jack O. Chu
: Atomic force microscopy studies of SiGe films and Si/SiGe heterostructures.
IBM Journal of Research and Development 39
(6): 629-638 (1995)
Coauthor
Index
1
Jack O. Chu
[
1
]
2
Randall M. Feenstra
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
