Daniel Fan

2003
3	EE	A. T. Sivaram, Daniel Fan, Jon Pryce: XML And Java For Open ATE Programming Environment. ITC 2003: 793-801
2	EE	Daniel Fan, Steve Roehling, Rusty Carruth: Case Study - Using STIL as Test Pattern Language. ITC 2003: 811-817
2002
1	EE	A. T. Sivaram, Daniel Fan, A. Yiin: Efficient Embedded Memory Testing with APG. ITC 2002: 47-54

Coauthor Index

1	Rusty Carruth	[2]
2	Jon Pryce	[3]
3	Steve Roehling	[2]
4	A. T. Sivaram	[1] [3]
5	A. Yiin	[1]

Colors in the list of coauthors