| |
| 2005 | ||
|---|---|---|
| 2 | EE | M. Estrada, A. Cerdeira, L. Resendiz, Benjamín Iñiguez, L. F. Marzal, J. Pallares: Effect of localized traps on the anomalous behavior of the transconductance in nanocrystalline TFTs. Microelectronics Reliability 45(7-8): 1161-1166 (2005) |
| 2004 | ||
| 1 | EE | V. Sánchez, J. Munguía, M. Estrada: Photo-CVD process for ultra thin SiO2 films. Microelectronics Reliability 44(5): 885-888 (2004) |
| 1 | A. Cerdeira | [2] |
| 2 | Benjamín Iñiguez | [2] |
| 3 | L. F. Marzal | [2] |
| 4 | J. Munguía | [1] |
| 5 | J. Pallares | [2] |
| 6 | L. Resendiz | [2] |
| 7 | V. Sánchez | [1] |