Sven Van Elshocht

2005
1	EE	Vidya Kaushik, Martine Claes, Annelies Delabie, Sven Van Elshocht, Olivier Richard, Thierry Conard, Erika Rohr, Thomas Witters, Matty Caymax, Stefan De Gendt: Observation and characterization of defects in HfO2 high-K gate dielectric layers. Microelectronics Reliability 45(5-6): 798-801 (2005)

Coauthor Index

1	Matty Caymax	[1]
2	Martine Claes	[1]
3	Thierry Conard	[1]
4	Annelies Delabie	[1]
5	Stefan De Gendt	[1]
6	Vidya Kaushik	[1]
7	Olivier Richard	[1]
8	Erika Rohr	[1]
9	Thomas Witters	[1]