| |
| 2005 | ||
|---|---|---|
| 2 | EE | V. Mikhelashvili, B. Meyler, J. Shneider, O. Kreinin, G. Eisenstein: Electrical properties of MIS capacitor using low temperature electron beam gun - evaporated HfAlO dielectrics. Microelectronics Reliability 45(5-6): 933-936 (2005) |
| 2001 | ||
| 1 | EE | V. Mikhelashvili, G. Eisenstein: Optical and electrical characterization of the electron beam gun evaporated TiO2 film. Microelectronics Reliability 41(7): 1057-1061 (2001) |
| 1 | O. Kreinin | [2] |
| 2 | B. Meyler | [2] |
| 3 | V. Mikhelashvili | [1] [2] |
| 4 | J. Shneider | [2] |