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| 2005 | ||
|---|---|---|
| 1 | EE | V. Mikhelashvili, B. Meyler, J. Shneider, O. Kreinin, G. Eisenstein: Electrical properties of MIS capacitor using low temperature electron beam gun - evaporated HfAlO dielectrics. Microelectronics Reliability 45(5-6): 933-936 (2005) |
| 1 | G. Eisenstein | [1] |
| 2 | O. Kreinin | [1] |
| 3 | B. Meyler | [1] |
| 4 | V. Mikhelashvili | [1] |