| |
| 1997 | ||
|---|---|---|
| 2 | EE | M. Eisele, Jörg Berthold, Doris Schmitt-Landsiedel, R. Mahnkopf: The impact of intra-die device parameter variations on path delays and on the design for yield of low voltage digital circuits. IEEE Trans. VLSI Syst. 5(4): 360-368 (1997) |
| 1996 | ||
| 1 | EE | M. Eisele, Jörg Berthold, Doris Schmitt-Landsiedel, R. Mahnkopf: The impact of intra-die device parameter variations on path delays and on the design for yield of low voltage digital circuits. ISLPED 1996: 237-242 |
| 1 | Jörg Berthold | [1] [2] |
| 2 | R. Mahnkopf | [1] [2] |
| 3 | Doris Schmitt-Landsiedel | [1] [2] |