Wern-Yih Duh

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1998

1 EE Kuen-Jong Lee, Jing-Jou Tang, Wern-Yih Duh: On the Determination of Threshold Voltages for CMOS Gates to Facilitate Test Pattern Generation and Fault Simulation. Asian Test Symposium 1998: 113-118

1998
1	EE	Kuen-Jong Lee, Jing-Jou Tang, Wern-Yih Duh: On the Determination of Threshold Voltages for CMOS Gates to Facilitate Test Pattern Generation and Fault Simulation. Asian Test Symposium 1998: 113-118

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