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2005 | ||
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1 | EE | M. Vasilopoulou, A. M. Douvas, D. Kouvatsos, P. Argitis, D. Davazoglou: Characterization of various insulators for possible use as low-k dielectrics deposited at temperatures below 200degreeC. Microelectronics Reliability 45(5-6): 990-993 (2005) |
1 | P. Argitis | [1] |
2 | D. Davazoglou | [1] |
3 | D. Kouvatsos | [1] |
4 | M. Vasilopoulou | [1] |