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| 2005 | ||
|---|---|---|
| 1 | EE | M. Vasilopoulou, A. M. Douvas, D. Kouvatsos, P. Argitis, D. Davazoglou: Characterization of various insulators for possible use as low-k dielectrics deposited at temperatures below 200degreeC. Microelectronics Reliability 45(5-6): 990-993 (2005) |
| 1 | D. Davazoglou | [1] |
| 2 | A. M. Douvas | [1] |
| 3 | D. Kouvatsos | [1] |
| 4 | M. Vasilopoulou | [1] |