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F. Dieudonné

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2001
1 F. Dieudonné, F. Daugé, J. Jomaah, C. Raynaud, F. Balestra: An overview of hot-carrier induced degradation in 0.25 mum Partially and Fully Depleted SOI N-MOSFET's. Microelectronics Reliability 41(9-10): 1417-1420 (2001)

Coauthor Index

1F. Balestra [1]
2F. Daugé [1]
3J. Jomaah [1]
4C. Raynaud [1]

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