| |
| 2001 | ||
|---|---|---|
| 1 | F. Dieudonné, F. Daugé, J. Jomaah, C. Raynaud, F. Balestra: An overview of hot-carrier induced degradation in 0.25 mum Partially and Fully Depleted SOI N-MOSFET's. Microelectronics Reliability 41(9-10): 1417-1420 (2001) | |
| 1 | F. Balestra | [1] |
| 2 | F. Daugé | [1] |
| 3 | J. Jomaah | [1] |
| 4 | C. Raynaud | [1] |