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2001 | ||
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1 | F. Dieudonné, F. Daugé, J. Jomaah, C. Raynaud, F. Balestra: An overview of hot-carrier induced degradation in 0.25 mum Partially and Fully Depleted SOI N-MOSFET's. Microelectronics Reliability 41(9-10): 1417-1420 (2001) |
1 | F. Balestra | [1] |
2 | F. Dieudonné | [1] |
3 | J. Jomaah | [1] |
4 | C. Raynaud | [1] |