| |
| 2000 | ||
|---|---|---|
| 2 | EE | André Ivanov, Vikram Devdas: Catastrophic Short and Open Fault Detection in Bipolar CML Circuits: A Case Study. J. Electronic Testing 16(6): 631-634 (2000) |
| 1998 | ||
| 1 | EE | Vikram Devdas, André Ivanov: Non-Intrusive Testing of High-Speed CML Circuits. Asian Test Symposium 1998: 172-178 |
| 1 | André Ivanov | [1] [2] |